Webinar Reminder

Fusion AX: Amp Up Your Devices

Probing atomic migration in PMTJ breakdown through in-situ analytical STEM

Coming Wednesday, the 12th of February, we will have the next installment of our webinar series surrounding electronic devices with Fusion AX! Don't forget to sign up! This next webinar will be presented by Dr. Hwanhui Yun:

Dr. Hwanhui Yun | The University of Minnesota, USA
This talk delves into an in-situ biasing TEM study of atomic migration during the breakdown of perpendicular magnetic tunnel junctions. Through advanced atomic-scale imaging and spectroscopy, two breakdown types are identified: soft breakdown, where tunnel magnetic resistance declines due to formation of pinholes in the dielectric MgO layer, and complete breakdown caused by joule heating and electromigration, leading to melting of MTJ layers. This study provides critical insight for designing durable spintronic devices, enhancing nanoscale device performance with real-time atomic-level analysis. In addition, in-situ heating study of Pt-Sn intermetallic alloys is also presented.

The fifth webinar in this series will take place in the 6th of March, by Dr. Tolga Wagner surrounding atomic biasing on semiconductor nanostructures.