Webinar Reminder

Fusion AX: Amp Up Your Devices

Biasing With a Twist - Prospects for Dynamic Operando Electron Microscopy

Coming Thursday, the 6th of March, we will have the last episode of our webinar series surrounding electronic devices with Fusion AX! Don't forget to sign up! This last webinar will be presented by Dr. Tolga Wagner:

Dr. Tolga Wagner, | Humbolt University, Berlin, Germany
Dynamic electron microscopy offers a unique window into the real-time behavior of semiconductor nanostructures under electrical bias, providing crucial insights into device performance and failure mechanisms. This talk explores recent advances in operando electron microscopy, focusing on the integration of focused ion beam (FIB) techniques for precise sample preparation and electrical biasing in switching devices. By employing time-resolved electron microscopy methods such as interference gating (iGate) and dynamic differential phase contrast (DPC), we investigate the dynamic potential distribution during device switching events, with temporal resolutions down to 1 ns. Utilizing a modified Protochips electrical biasing holder, specially designed for RF applications, we achieve unprecedented insight into fast electronic processes. This enables a new understanding of how localized electric fields evolve and affect device functionality in operando conditions. Our findings highlight the potential of dynamic EM for studying fast switching processes, offering new avenues for the design and optimization of semiconductor technologies.

Did you enjoy this webinar series? Stay tuned for new series to come this year!